Demande #3323
ferméDisque dur interne laptop absinthe FAILING_NOW
100%
Description
Salut,
hier soir j'ai eu une alerte smartctl concernant mon disque dur.
Je vous mets ci-dessous le résultat de smartctl -a /dev/sda et un
extrait inquiétant :
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
233 Media_Wearout_Indicator 0x0013 001 001 001 Pre-fail Always FAILING_NOW 146800
Je vais relancer un test mais a priori ça ne sent pas bon. Même si je ne
sais pas vraiment interprété le résultat de smartctl. Par sécurité je
vais commander un disque.
Sur
That still doesn't guarantee when/if you'll see failures or
errors. Drive could fail tomorrow, could fail in three years.
voir aussi
https://www.thomas-krenn.com/en/wiki/SMART_attributes_of_Intel_SSDs
Selon smartctl mon disque est SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
C'est un 250 Go, je prendrais bien une capacité un peu supérieure (je
suis à 90% d'utilisation disque).
LDLC propose https://www.ldlc.com/informatique/pieces-informatique/disque-ssd/c4698/+fv63-10416+fv32-10948.html
Des conseils/suggestions par rapport à la liste LDLC ?
Un changement de disque M.2 est facile à faire ? Il faut un outillage
spécifique ?
<----------------------------------------------------------------------------------
- smartctl -a /dev/sda
smartctl 6.6 2016-05-31 r4324 [x86_64-linux-4.17.0-3-amd64] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: SAMSUNG MZNTY256HDHP-000L7
Serial Number: S305NYAH634440
LU WWN Device Id: 5 002538 d00000000
Firmware Version: MAT23L6Q
User Capacity: 256 060 514 304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: M.2
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-2, ATA8-ACS T13/1699-D revision 4c
SATA Version is: SATA 3.1, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Sep 25 09:38:24 2018 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: FAILED!
Drive failure expected in less than 24 hours. SAVE ALL DATA.
See vendor-specific Attribute list for failed Attributes.
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 72) The previous self-test completed having
a test element that failed and the test
element that failed is not known.
Total time to complete Offline
data collection: ( 0) seconds.
Offline data collection
capabilities: (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 097 097 000 Old_age Always - 10171
12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 1406
170 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0
171 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0
172 Unknown_Attribute 0x0032 100 100 010 Old_age Always - 0
173 Unknown_Attribute 0x0033 006 006 005 Pre-fail Always - 793
174 Unknown_Attribute 0x0032 099 099 000 Old_age Always - 62
178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always - 0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0013 100 100 010 Pre-fail Always - 1863
184 End-to-End_Error 0x0033 100 100 097 Pre-fail Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
194 Temperature_Celsius 0x0032 063 038 000 Old_age Always - 37 (Min/Max 0/62)
199 UDMA_CRC_Error_Count 0x003e 100 100 000 Old_age Always - 0
233 Media_Wearout_Indicator 0x0013 001 001 001 Pre-fail Always FAILING_NOW 146800
241 Total_LBAs_Written 0x0032 099 099 000 Old_age Always - 25927
242 Total_LBAs_Read 0x0032 099 099 000 Old_age Always - 38221
249 Unknown_Attribute 0x0032 099 099 000 Old_age Always - 203184
SMART Error Log Version: 1
No Errors Logged
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
- 1 Short offline Completed: unknown failure 80% 10171 0
- 2 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
255 0 65535 Read_scanning was never started
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.